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• Release Date: 08-02-2006
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It integrates both traditional and contemporary modeling approaches
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HIGH ENERGY ELECTRON DIFFRACTION AND MICROSCOPY Cyber Security & Cyber Law • Release Date: 08-02-2006Book Details Publisher: Oxford University Press Author: Peng, L. M. Language: English Edition: Illustrated ISBN: 9780199602247 Pages: 560 Cover: Paperback Dimensions: 9. 1 x 6. 1 x 1. 3 inches About the Book High Energy Electron Diffraction and Microdiffraction by L. M. Peng provides a comprehensive introduction to the principles of high energy electron diffraction (HEED), focusing particularly on its applications to modern electron microscopy. This
